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 UFD >> UD-YUT2620
  
 

  

 

Flaw DetectorUD-YUT-2620.pdf

Features and Functions

The rugged UD-YUT2620 is designed for the severe environment. Its domestically unique Omni seal design enables it to resist the damp, sandstorm, dust, and pollution in all sorts of environmental extremes ranging from ocean to desert.

The full screen function enables the echo wave displaying area to cover the entire screen so that the operator will have the maximal view.

The solid waveform can add the waveform visual contrast and omission will hardly happen during the fast testing.

The bulk memory can store up to 1,000 data sets, including waveforms, curves, and parameters (including the traditional 1,000 channels)

Through echo wave-echo wave thickness measurement, the zero calibration can be avoided, and the net thickness of the base material can be directly measured through the coating

Wave crest memory: the real-time envelope can display the highest wave of the flaw and record the maximum value of the flaw to help the exact positioning and fast testing of the flaw as well as the qualitative analysis by the envelope waveform..

Automatic gain: automatically adjust the gain to the pre-set amplitude height.

Warning function: afferent echo/lost wave alarm

Real-time clock: automatically record the date and time of the stored waveform

Display freeze: catching the waveform and the sound path data at any moment and removing the hatch after freezing to measure the echo wave parameters.

Flaw positioning: real-time displaying sound path S, horizontal height X, depth Y, and wave height H

Digital inhibition: 0-80%, increasing by 1%, not affecting the linearity and gain.

DAC curvilinear distance compensation: the device is designed for distance compensation. When the resolving power in the near field is not influenced, only the remote signal will be compensated for its sensitivity so as to improve the testing range of the device significantly.

Two independent measurement shutters can monitor the distances of the echo amplitude and the sound path.

When the flaw detection is carried out through transverse wave, the secondary and the third waves flaw depth will be automatically calculated according to the plating thickness.

The perfect DAC/AVG curve functions enable the curves to change according to the displacement of the gain and the sound path.

The brightness of the true-color TFT LCD can be adjusted with many free selections of color schemes.

Two units of millimeter and inch are supported.

Two language interfaces of Chinese and English are supported.

Data communication: communicating with the computer through the RS232 interface to transfer the waveform and data so as to manage the results of the flaw on the computer, generate the flaw testing reports and print them out.

Technical Parameters

Working Frequency (0.5-15) MHZ

Material Sound Velocity: (1,000-9,999) m/s

Operation Mode: pulse echo, double crystal

Pulse Shift: (0-2,000) mm

Probe Zero: (0-199, 99) us

Gain Control: (0-110) dB, in steps of 0.1dB, 2 dB, 6 dB

Vertical Linearity Error: 3%

Horizontal Linearity Error: 0.3%

Definition: 32 dB

Dynamic Range: 30 dB

Sensitivity Excess: 55 dB

Average Noise Level: 10%

TFT Color LCD: 5.7 inches

Battery Working Hours: 8 hours

Working Temperature:-10~50

Power Supply: 220VAC, 11VDC

External Dimension: 270mm190mm60mm

Weight: 1.5Kg, excluding batteries

 
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